Scanning Electron Microscopy (SEM)
Ductile tearing revealing a dimpled internal fracture surface in the unstable crack propagation regime of a fatigued bolt.
Pitting and cracking on the external surface of a fitting.
Crack branching through the quenched and tempered microstructure of a 41XX series steel taken at 20,000 X original magnification revealing the dispersion of fine, sub-micron carbides throughout the microstructure.
How Does It Work?
Where an optical microscope uses light to image a sample and delivers that light to either your eyes or a detector, a scanning electron microscope uses an electron beam to image a sample and uses a detector or variety of detectors to collect the information. An electron beam is generated from a filament and then focused using electromagnetic lenses into a fine beam as the electrons travel from their source to the sample.
Advantages
Disadvantages
When should it be used?
Other Testing Services We Offer
Find Us
KnightHawk Engineering, Inc.
400 Hobbs Rd
League City, TX 77573
(281) 282-9200 telephone
(281) 282-9333 fax
General Information: hawkwork@knighthawk.com
Sales, Marketing, Business Development and Conferences: Nathan Knight
Customer Support: Chris Creech
KnightHawk Engineering is Available
24 hours a day / 7 days a week.