Scanning Electron Microscopy (SEM)

Ductile tearing revealing a dimpled internal fracture surface in the unstable crack propagation regime of a fatigued bolt.

Pitting and cracking on the external surface of a fitting.

Crack branching through the quenched and tempered microstructure of a 41XX series steel taken at 20,000 X original magnification revealing the dispersion of fine, sub-micron carbides throughout the microstructure.
How Does It Work?
Where an optical microscope uses light to image a sample and delivers that light to either your eyes or a detector, a scanning electron microscope uses an electron beam to image a sample and uses a detector or variety of detectors to collect the information. An electron beam is generated from a filament and then focused using electromagnetic lenses into a fine beam as the electrons travel from their source to the sample.
Advantages
Disadvantages
When should it be used?
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KnightHawk Engineering, Inc.
400 Hobbs Rd
League City, TX 77573
(281) 282-9200 telephone
(281) 282-9333 fax
General Information: hawkwork@knighthawk.com
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Customer Support: Chris Creech
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24 hours a day / 7 days a week.